Incident and transmitted light microscopes Panthera TEC MAT

Incident and transmitted light microscopes for science materials, inspection of semiconductor components, LCD displays and wafers, equipped with an intelligent brightfield / darkfield illumination concept. The microscope models with additionally integrated LED transmitted light expand the application options in the direction of complex composite materials.

• Tube type Siedentopf, swiveling
• Widefield oculars for spectacle wearers with diopter adjustment on both oculars
• CCIS^® Plan Achromat & S-APO (PB free), DIN objectives
• Reversed coded nosepiece
• LED incident light illuminator with field and aperture diaphragm, with slots for polariser / analyser sliders
• With interchangeable illumination
• Motic LightTracer: Light memory, sleep mode (auto on-off), nosepiece LED light intensity and mode indicator
• Coaxial coarse and fine focusing system with tension adjustment
• Integrated power supply with sleep mode
• USB 2.0 for external camera power

Additional equipment depending on the model with bright field (transmitted light), segmentable dark field (reflected light), polarization (reflected light)

Scope of supply: Dust cover, power cord, allen key, screws for metal extension support

• Specifications
• Inclination Tube: 25°
• Angle of rotation Tube: 360°
• Eyepieces: Widefield UC-WF10X/22 mm
• Nosepiece: Quintuple
• Objectives: 5X/0.13 (AA 20.3 mm), 10X/0.25 (AA 17.5 mm), 20X/0.40 (AA 8.1 mm), S-Apo 50X/0.80 (AA 1 mm)
• Interpupillary distance: 48 … 75 mm
• Condenser: LED condenser
• Illumination: 3 W LEDs
• Fine focus increment:
  Focusing stroke: 2 µm
  25 mm
• Dimensions Stage (W x D): 300 x 180 mm
• Dimensions (W x D x H): 410 x 300 x 450 mm
• Net weight: 10,4 kg
• Power supply: 110 … 240 V, 50 / 60 Hz